كلية الهندسة - جامعة عين شمس, الرئيسية
MEMS/NEMS Characterization: Systems and Methods
What Will Learn?
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Course AimsBy the end of the course the students will be able: • To understand the basic principles and techniques of MEMS/NEMS fabrication and characterization. • To learn how to design, model, simulate, and test MEMS/NEMS devices and systems for various applications. • To explore the current research trends and challenges in MEMS/NEMS technology and applications. • To develop critical thinking and problem-solving skills for MEMS/NEMS engineering.
Requirements
MCT343
Description
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English Description
Introduction to MEMS characterization, fundamentals of light, Laser doppler velocimetry, Two-beam interference, Spectrometers, Spectral Imaging, Microscopy, Coherence Imaging, Optical Profilometry, Scanning Probe microscopes, Impedance Analyses, Frequency Response extraction -
Arabic Description
Introduction to MEMS characterization, fundamentals of light, Laser doppler velocimetry, Two-beam interference, Spectrometers, Spectral Imaging, Microscopy, Coherence Imaging, Optical Profilometry, Scanning Probe microscopes, Impedance Analyses, Frequency Response extraction
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قسمهندسة الميكاترونيات
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الساعات المعتمدة3
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الدرجاتالإجمالي ( 100 ) = نصف العام (25) + tr.Major Assessment (30 = tr.Industry 4% , tr.Project 12% , tr.Self_learning 4% , tr.Seminar 15% ) + tr.Minor Assessment (5) + درجة الامتحان (40)
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الساعاتساعات المحاضرة: 2, ساعات التعليم: 2, ساعات المعمل: 1
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Required SWL125
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Equivalent ECTS5
- • Jeremy Ramsden, “Nanotechnology: An Introduction”, William Andrew, 2016.
- • Tai-Ran Hsu, “MEMS and Microsystems: design, manufacture, and nanoscale engineering”, John Wiley & Sons, Inc., Hoboken, New Jersey, 2nd Edition, 2008. (ISBN 978-0-470-08301-7)
- • Sami Franssila, “Introduction to Microfabrication”, Johnwiley & son, Ltd, 2004. - Jeremy Ramsden, Nanotechnology: An Introduction, William Andrew, 2016.