Faculty of Engineering - Ain Shams University, Home
VLSI Technology
What Will Learn?
-
Course AimsThe course aims to: • Build the student background in issues related to electronic technology. • Help students develop a thorough understanding of different integrated circuits fabrication processes, their environment, and their requirements.
-
Course Goals
- Decent Work and Economic Growth
- Industry, Innovation and Infrastructure
- Responsible Consumption and Production
Requirements
ECE222
Description
-
English Description
IC Processing, Clean Rooms and Clean Room Technology, Bulk Crystal growth, Epitaxial growth, Photolithography, Etching, Oxidation process, Diffusion process, Chemical vapour deposition CVD, Evaporation and multilayer coating, Ionic exchange process, Fabrication of passive and active components, Process integration and standard technologies, Layout design rules, Layout parasitics, Layout techniques, Interconnect modeling. -
Arabic Description
IC Processing, Clean Rooms and Clean Room Technology, Bulk Crystal growth, Epitaxial growth, Photolithography, Etching, Oxidation process, Diffusion process, Chemical vapour deposition CVD, Evaporation and multilayer coating, Ionic exchange process, Fabrication of passive and active components, Process integration and standard technologies, Layout design rules, Layout parasitics, Layout techniques, Interconnect modeling.
-
DepartmentElectronics and Communications Engineering
-
Credit Hours3
-
GradesTotal ( 100 ) = Midterm (20) + tr.Major Assessment (35 = tr.Industry 0% , tr.Project 35% , tr.Self_learning 0% , tr.Seminar 5% ) + tr.Minor Assessment (5) + Exam Grade (40)
-
HoursLecture Hours: 3, Tutorial Hours: 1, Lab Hours: 0
-
Required SWL125
-
Equivalent ECTS5
- • R. J. Baker, “CMOS: Circuit Design, Layout, and Simulation,” 4th Edition, IEEE Press Series on Microelectronic Systems, 2019.
- • S. Campbell, “Fabrication Engineering at the Micro- and Nanoscale,” 4th Edition, Oxford University Press, 2013.
- • A. Hastings, “The Art of Analog Layout,” 2nd Edition, Pearson, 2005.